Advertisement

Topics

Development of novel electron microscopy techniques to extract obscured information on material properties

03:40 EDT 31 Jul 2017 | Physorg.COM

NIMS researchers Bo Da (researcher at the RCAMC and the CMI2, MaDIS) and Hideki Yoshikawa (leader of the Surface Chemical Analysis Group) and a research group led by Shigeo Tanuma (NIMS Special Researcher), Kazuhito Tsukakoshi (MANA Principal Investigator, NIMS), Kazuyuki Watanabe (Professor, Tokyo University of Science) and Zejun Ding (Professor, University of Science and Technology of China) jointly developed versatile spectroscopic microscopy techniques capable of simultaneously measuring a nano-thin film at a wide range of electron energy levels, from almost zero energy to high energy, using a microscope employing electron beams. The group also demonstrated the effectiveness of the technique.

Original Article: Development of novel electron microscopy techniques to extract obscured information on material properties

NEXT ARTICLE

More From BioPortfolio on "Development of novel electron microscopy techniques to extract obscured information on material properties"

Quick Search
Advertisement