Search Results for "Ion Induced Secondary Electron Yield"
Original Source: Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams.
In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken to form images, for their yield is high and strongly dependent on the surface characteristics, in terms of chemical composition and topography. In particular, the secondary electron yield varies characteristically with the angle formed by the beam and the direction normal to the sample surface in the point of i...
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The combination of a direct electron-detection camera that can count individual electrons and an algorithm for correcting for beam-induced motion in cryo-EM will facilitate determination of three-dime...
Fluorescent and photo-oxidizing TimeSTAMP tags track protein fates in light and electron microscopy
Butko and colleagues report the invention of fluorescent and photo-oxidizing versions of a molecular probe named TimeSTAMP that allows temporal tagging of newly-synthesized proteins of interest. The s...
"Transparent Brain" Expected to Yield Breakthroughs in Understanding Neurological ...
Replacement of the brain's fat content with a clear, permeable gel allows optical, fluorescent, and electron microscope studies as...
A 24 π-electron antiaromatic hexaphyrin derivative (rosarin) with a near-planar geometry enforced by bridging phenylene groups has been shown to undergo a proton-coupled electron transfer reduction w...
Electron microscopes with a twist
This press release is available in German . Nowadays, electron microscopes are an essential tool, especially in the field of materials science. At TU Vienna, electron beams are being created t...
Dodecagonal tiling in mesoporous silica
Recent advances in the fabrication of quasicrystals in soft matter systems have increased the length scales for quasicrystals into the mesoscale range (20 to 500 ångströms). Thus far, dendritic liqu...
Fusion helped by collision science
An international team of physicists has calculated the efficiency of a reaction involving an incoming electron kicking out an electron [...]
Transgenic insect resistance traits increase corn yield and yield stability
"Commercial corn breeding programs, which measure yield on millions of plots per year, provide a unique opportunity to observe yield effects over multiple years and locations. In experiments spanning...
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Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams.
In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken...
Electron-Induced Dissociation of CO(2) on TiO(2)(110).
The electron-induced dissociation of CO(2) adsorbed at the oxygen vacancy defect on the TiO(2)(110) surface has been investigated at the single-molecular level using scanning tunneling microscopy (STM...
Ultrahigh resolution focused electron beam induced processing: the effect of substrate thickness.
It is often suggested that the growth in focused electron beam induced processing (FEBIP) is caused not only by primary electrons, but also (and even predominantly) by secondary electrons (SEs). If th...
Monte Carlo simulation on a gold nanoparticle irradiated by electron beams.
This study investigated the secondary electron production from a gold nanoparticle (GNP) irradiated by monoenergetic electron beams using Monte Carlo (MC) simulation. Spherical GNPs with diameters of...
Electron paramagnetic resonance (EPR) was used to study light-induced electron transfer in Photosystem I-flavodoxin complexes. Deuteration of flavodoxin enables the signals of the reduced flavin accep...
