None

Full-Wafer DualBeam Analysis System

FEI Co. has introduced the Helios NanoLab 1200AT, the newest generation of its full-wafer DualBeam analysis systems.Read more about Full-Wafer DualBeam Analysis SystemComments

Acadia Has A Silver Lining In Its Playbook

By PTSD Trader:Tiffany: "What meds are you on?" Pat: "Me? None. I used to be on Lithium and Seroquel and Abilify but I don't take them anymore, no. They make me foggy and they also make me bloated." T...

Wafer Cleaning Market is poised to grow at a CAGR of 16.1% & to reach $5.86 billion by 2017 - New Report by MarketsandMarkets

(PRWEB) February 16, 2013 According to a new market report Wafer Cleaning Market (2012–2017) published by MarketsandMarkets, the total market is expected to reach $5.86 billion by 2017, at a C...

Wafer-scale integration of group III–V lasers on silicon using transfer printing of epitaxial layers

The realization of GaAs lasers on a silicon substrate using a print transfer process offers an alternative wafer-bonding technique for the hybrid integration of optoelectronics.

Cutting-edge startup aims for nano-close shave

Nano-Sharp Inc., a new company founded using technology developed at the University of California Davis, plans to use silicon wafers to make razor blades and surgical tools far more cheaply than cu...

Aetrium Introduces New Wafer Level Reliability Test Platform

ST. PAUL, Minn., April 16, 2013 (GLOBE NEWSWIRE) -- Aetrium Incorporated (Nasdaq:ATRM) today introduced a new Wafer Level Reliability (WLR) test platform to its portfolio of reliability test products...

LFoundry Agrees to Acquire Micron Technology Wafer Manufacturing Plant in Italy

BOISE, Idaho and LANDSHUT, Germany, Feb. 25, 2013 (GLOBE NEWSWIRE) -- Micron Technology, Inc. (Nasdaq:MU) and LFoundry today announced that the companies have entered into agreements for LFoundry to...

Nurses Lead the Way to Better Diabetes Tx

(MedPage Today) -- PHOENIX - A program led by certified diabetes nurse educators helped patients titrate insulin and improve key diabetes parameters, researchers reported here.

Thickness and refractive index measurement of a silicon wafer based on an optical comb.

We have proposed and demonstrated a novel method that can determine both the geometrical thickness and refractive index of a silicon wafer at the same time using an optical comb. The geometrical thick...

Tilt-modulated spatial phase imaging method for wafer-mask leveling in proximity lithography.

We demonstrate a tilt-modulated phase imaging method to adjust the gap inconsistency for wafer-mask leveling in proximity lithography. Two gratings with close periods are etched on the mask and used a...

Post-CMOS wafer level growth of carbon nanotubes for low-cost microsensors--a proof of concept.

Here we demonstrate a novel technique to grow carbon nanotubes (CNTs) on addressable localized areas, at wafer level, on a fully processed CMOS substrate. The CNTs were grown using tungsten micro-heat...

Nanophase Evolution at Semiconductor/Electrolyte Interface in Situ Probed by Time-Resolved High-Energy Synchrotron X-ray Diffraction.

Real-time evolution of nanoparticles grown at the semiconductor/electrolyte interface formed between a single crystalline n-type GaAs wafer and an aqueous solution of AgNO(3) has been studied by using...

Wafer-scale graphene integrated circuit.

A wafer-scale graphene circuit was demonstrated in which all circuit components, including graphene field-effect transistor and inductors, were monolithically integrated on a single silicon carbide wa...