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Observation of Plasmon Energy Gain for Emitted Secondary Electron in vacuo.

08:00 EDT 12th September 2019 | BioPortfolio

Summary of "Observation of Plasmon Energy Gain for Emitted Secondary Electron in vacuo."

Plasmon gain by core-level electrons or elastic electrons observed in past studies seems to be of no practical value in material characterization, mainly because of their ultra-low signal intensities. Nevertheless, in the emission spectra of Au samples, we have observed plasmon gain in secondary electrons. The electrons gain energy from surface plasmons after escaping from the surface, and thereby only carry surface-plasmon information in the vacuum above the surface. Because the intensity of the emitted SEs is strong, rivalling that of core-level or elastic electrons, the observed phenomenon has in practice the potential to image directly in space the surface plasmon near but exterior to the metal surface.

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Name: The journal of physical chemistry letters
ISSN: 1948-7185
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Medical and Biotech [MESH] Definitions

A technique for analysis of the chemical composition of molecules. A substance is bombarded with monochromatic ELECTRONS. Some of the electrons passing through the specimen will lose energy when they ionize inner shell electrons of the atoms in the specimen. The energy loss is element dependent. Analysis of the energy loss spectrum reveals the elemental composition of a specimen. ENERGY-FILTERED TRANSMISSION ELECTRON MICROSCOPY is a type of electron energy loss spectroscopy carried out in electron microscopes specially outfitted to analyze the spectrum of electron energy loss.

An analytical transmission electron microscopy method using an electron microscope fitted with an energy filtering lens. The method is based on the principle that some of the ELECTRONS passing through the specimen will lose energy when they ionize inner shell electrons of the atoms in the specimen. The amount of energy loss is dependent upon the element. Analysis of the energy loss spectrum (ELECTRON ENERGY-LOSS SPECTROSCOPY) reveals the elemental composition of a specimen. It is used analytically and quantitatively to determine which, how much of, and where specific ELEMENTS are in a sample. For example, it is used for elemental mapping of PHOSPHORUS to trace the strands of NUCLEIC ACIDS in nucleoprotein complexes.

The spectrometric analysis of fluorescent X-RAYS, i.e. X-rays emitted after bombarding matter with high energy particles such as PROTONS; ELECTRONS; or higher energy X-rays. Identification of ELEMENTS by this technique is based on the specific type of X-rays that are emitted which are characteristic of the specific elements in the material being analyzed. The characteristic X-rays are distinguished and/or quantified by either wavelength dispersive or energy dispersive methods.

Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.

Penetrating, high-energy electromagnetic radiation emitted from atomic nuclei during NUCLEAR DECAY. The range of wavelengths of emitted radiation is between 0.1 - 100 pm which overlaps the shorter, more energetic hard X-RAYS wavelengths. The distinction between gamma rays and X-rays is based on their radiation source.

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