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We present an Unsupervised Domain Adaptation strategy to compensate for domain shifts on Electron Microscopy volumes. Our method aggregates visual correspondences-motifs that are visually similar across different acquisitions-to infer changes on the parameters of pretrained models, and enable them to operate on new data. In particular, we examine the annotations of an existing acquisition to determine pivot locations that characterize the reference segmentation, and use a patch matching algorithm to find their candidate visual correspondences in a new volume. We aggregate all the candidate correspondences by a voting scheme and we use them to construct a consensus heatmap: a map of how frequently locations on the new volume are matched to relevant locations from the original acquisition. This information allows us to perform model adaptations in two different ways: either by a) optimizing model parameters under a Multiple Instance Learning formulation, so that predictions between reference locations and their sets of correspondences agree, or by b) using high-scoring regions of the heatmap as soft labels to be incorporated in other domain adaptation pipelines, including deep learning ones. We show that these unsupervised techniques allow us to obtain high-quality segmentations on unannotated volumes, qualitatively consistent with results obtained under full supervision, for both mitochondria and synapses, with no need for new annotation effort. 1.
This article was published in the following journal.
Name: IEEE transactions on medical imaging
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A tomographic technique for obtaining 3-dimensional images with transmission electron microscopy.
Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
The use of instrumentation and techniques for visualizing material and details that cannot be seen by the unaided eye. It is usually done by enlarging images, transmitted by light or electron beams, with optical or magnetic lenses that magnify the entire image field. With scanning microscopy, images are generated by collecting output from the specimen in a point-by-point fashion, on a magnified scale, as it is scanned by a narrow beam of light or electrons, a laser, a conductive probe, or a topographical probe.
A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
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