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High photosensitive Indium-Gallium-Zinc Oxide Thin-Film Phototransistor with a Selenium Capping Layer for Visible Light Detection.

07:00 EST 13th February 2020 | BioPortfolio

Summary of "High photosensitive Indium-Gallium-Zinc Oxide Thin-Film Phototransistor with a Selenium Capping Layer for Visible Light Detection."

Visible light can be detected using an indium-galium-zinc oxide (IGZO) based phototransistor, with a selenium capping layer (SCL) that functions as a visible light absorption layer. Selenium (Se) exhibits photoconductive properties as its conductivity increases illuminated. We report an IGZO phototransistor with an SCL (SCL/IGZO phototransistor) that demonstrated optimal photoresponse characteristics when the SCL was 150 nm thick. The SCL/IGZO phototransistor exhibited a photoresponsivity of 1.39 × 10 A/W, photosensitivity of 4.39 × 10, detectivity of 3.44 × 10 Jones, and external quantum efficiency of 3.52 × 10 % when illuminated by green light (532 nm). Ultraviolet-visible spectroscopy and ultraviolet photoelectron spectroscopy analysis showed that Se has a narrow energy band gap, in which visible light is absorbed and forms a p-n junction with IGZO so that photo-generated electron-hole pairs are easily separated, which makes recombination more challenging. We show that electrons generated in the SCL flow through the IGZO layer, which enables the phototransistor to detect visible light. Furthermore, the SCL/IGZO phototransistor exhibited excellent durability and reversibility owing to the constant light and dark current and the time-dependent photoresponse characteristics over 8,000 s when a red light (635 nm) source was turned on and off at a frequency of 0.1 Hz.

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This article was published in the following journal.

Name: ACS applied materials & interfaces
ISSN: 1944-8252
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